8:45 AM

         Welcome/Introductions

9:00AM

Moving from Reliability to Manufacturability

Bill Roesch

TriQuint Semiconductor

10:30 AM

Break

10:45 AM

Failure Analysis – Fault Localization

Kevin Berger

Analytical Solutions, Inc.

11:45 AM

Lunch

12:45 PM

Transmission Electron Microscopy Based Failure Analysis

Mike Salmon

Evans Analytical Group

Electrical, Thermal and Environmental Reliability of Transistors:  Experimental Techniques to Identify Fundamental Degradation Mechanisms

Professor Jesus del Alamo,

Massachusetts Institute of Technology

Break

Fully Coupled Process and Device Simulation for Understanding Reliability

Professor Mark Law,

University of Florida

Modern Thermography for Semiconductor Technology for Reliability Testing: Channel Temperature and Stresses/Strains in Devices

Professor Martin Kuball,

University of Bristol

End of Program