Observations of Current Blocking in InP/GaAsSb DHBTs
Benjamin F. Chu-Kung, Shyh-Chiang Shen*, Walid Hafez, and Melton Feng
Department of Electrical and Computer Engineering –
Micro and Nanotechnology Laboratory –
Phone: (217)333-4048, e-mail firstname.lastname@example.org
*Xindium Technologies, Inc., 100 GTrade Centre Drive, Suite 304, Champaign, IL 61820
Keywords : HBT, InP, GaAsSb, Current Blocking
Type II InP/GaAsSb transistors have attracted much interest in high speed microelectronics. However, Kirk-effect-induced current blocking was observed, limiting the highest achievable current density and hence the speed. In this work, we present an explanation as to the cause of current blocking in the InP/GaAsSb DHBTs. The effects of collector thickness are investigated and methods to achieve higher current densities are proposed.