P A P E R    T I T L E
Key Considerations and New Advances in High Volume Production for Millimeter-wave MMICs

A U T H O R  /  C R E D I T S
Greg McCarter, John Barr
Hewlett-Packard Company

A B S T R A C T
Millimeter-wave MMIC volumes are forecast to experience tremendous growth in the next decade. Current manufacturing strategies must be re-visited to achieve the cost-of-test required to remain competitive and enable these new commercial markets. Current manufacturing approaches and limitations for millimeter-wave MMICs will be reviewed.

Progress on new, high throughput manufacturing solutions will be presented. Factors in bringing new devices to production more quickly and achieving high throughput without sacrificing measurement performance, repeatability, and system usability will be covered. Test time benchmarks will be presented for example devices.