An Efficient On-Wafer Production Test System for MMW Power MMICs with Diagnostic Flag Capability
A U T H O R / C R E D I T S
R.G. Freitag, K.M. Renaldo, J.G. Burns and H.G. Henry
Northrop Grumman Corporation
Electronic Sensors and Systems Sector, Baltimore, MD.
A B S T R A C T
An on-wafer production test system has been developed which provides 100% dc and rf screening of millimeter-wave power MMICs to customer specifications. The test software is modular making it easily adaptable to unique customer requirements and is attached to a linked database for rapid data analysis and chip delivery. A principal feature of the system is its sophisticated network of failure flags which are used to highlight potential processing/design problems. The flags are linked to a series of diagnostic tests performed on every MMIC in addition to the usual rf measurements such as power output, gain and drain/gate current. The diagnostic tests screen out non-compliant MMICs before RF test thereby minimizing test time. Pareto analyses will be presented showing the utility of the flags in diagnosing specific processing problems.
GaAs MANTECH, Inc.
Campus Box 1127
One Brookings Drive
St. Louis, MO 63130-4899
314.935.5575 Info@GaAsMantech.org
